Submicronic Laue diffraction to determine in-depth strain in very closely matched complex HgCdTe/CdZnTe heterostructures with a 10−5 resolution

Biquard, X.; Ballet, P.; Tuaz, A.; Jouneau, P.H.; Rieutord, F.

doi:10.1107/S1600577520013211

Journal of Synchrotron Radiation Journal of
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Figure 3
As-grown sample made of a 4.5 µm-thick MBE-grown HgCdTe/CdZnTe abrupt structure. (a) SIMS profiles with respective cadmium (black, left scale) and zinc (blue, right scale) fraction. (b) Micro-Laue measurements with Hg fluorescence (green, right scale) and micro-diffraction derived strain (red, left scale).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 28| Part 1| January 2021| Pages 181-187

https://doi.org/10.1107/S1600577520013211

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