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Figure 7
Additional flat-field analysis. (a) Comparison of the collimated and nano-focused SASE beam. The graph shows the explained variance (solid) and residuum (dashed) as a function of the number of components. (b) Decay of the modulus of the component weights on a logarithmic scale (nano-focus CRL), presented as an extension of Fig. 5[link](d). Even though the contribution drops well below the 1% level (relative to the weight of the first component), the higher components can contain localized information, which are beneficial for the correction.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 28| Part 1| January 2021| Pages 52-63
https://doi.org/10.1107/S160057752001557X
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