Single-pulse phase-contrast imaging at free-electron lasers in the hard X-ray regime

Hagemann, J.; Vassholz, M.; Hoeppe, H.; Osterhoff, M.; Rosselló, J.M.; Mettin, R.; Seiboth, F.; Schropp, A.; Möller, J.; Hallmann, J.; Kim, C.; Scholz, M.; Boesenberg, U.; Schaffer, R.; Zozulya, A.; Lu, W.; Shayduk, R.; Madsen, A.; Schroer, C.G.; Salditt, T.

doi:10.1107/S160057752001557X

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Figure 7
Additional flat-field analysis. (a) Comparison of the collimated and nano-focused SASE beam. The graph shows the explained variance (solid) and residuum (dashed) as a function of the number of components. (b) Decay of the modulus of the component weights on a logarithmic scale (nano-focus CRL), presented as an extension of Fig. 5

(d). Even though the contribution drops well below the 1% level (relative to the weight of the first component), the higher components can contain localized information, which are beneficial for the correction.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 28| Part 1| January 2021| Pages 52-63

https://doi.org/10.1107/S160057752001557X

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