Characterization of the Percival detector with soft X-rays

Marras, A.; Correa, J.; Lange, S.; Vardanyan, V.; Gerhardt, T.; Kuhn, M.; Krivan, F.; Shevyakov, I.; Zimmer, M.; Hoesch, M.; Bagschik, K.; Scholz, F.; Guerrini, N.; Marsh, B.; Sedgwick, I.; Cautero, G.; Giuressi, D.; Iztok, G.; Menk, R.H.; Scarcia, M.; Stebel, L.; Nicholls, T.; Nichols, W.; Pedersen, U.K.; Shikhaliev, P.; Tartoni, N.; Hyun, H.; Kim, S.; Kim, K.; Rah, S.; Dawiec, A.; Orsini, F.; Pinaroli, G.; Greer, A.; Aplin, S.; Jewell, A.D.; Jones, T.J.; Nikzad, S.; Hoenk, M.E.; Okren, F.; Graafsma, H.; Wunderer, C.B.

doi:10.1107/S1600577520013958

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Figure 7
Soft X-ray (250 eV) diffraction through a circular pinhole: fixed (very-high) gain operation. Note that the top of the main peak is limited by the maximum full-well in this mode (a few thousand electrons). The horizontal stripe artefact related to the region of maximum illumination is discussed in Section 5.3

JOURNAL OF
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ISSN: 1600-5775

Volume 28| Part 1| January 2021| Pages 131-145

https://doi.org/10.1107/S1600577520013958

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