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Figure 6
Soft X-ray reflectivity data along with best-fit theoretical simulations of 75 bi-layer Cr/Ti and Cr/C/Ti ML samples measured at a 2.77 nm soft X-ray wavelength with synchrotron radiation.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 28| Part 1| January 2021| Pages 224-230
https://doi.org/10.1107/S1600577520013429
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