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Figure 1
Plot of the measurable spatial frequency range of various surface measurement instruments. The extension of XRR presented in this work, `Long-range' XRR, overlaps a substantial amount of the waviness and roughness regions and can be used instead of multiple measuring instruments.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 28| Part 1| January 2021| Pages 71-77
https://doi.org/10.1107/S1600577520013314
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