view article
Figure 6
Filtered profilometer results, filtered at (1/16) µm−1. While the profilometer could easily measure the waviness features, the high-frequency content includes instrument noise.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 28| Part 1| January 2021| Pages 71-77
https://doi.org/10.1107/S1600577520013314
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS