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Figure 5
(a) Ensemble of the stitched epilayers of 10 µm raw images located at the peak position of the rocking curve from the section topographs of the MCT epilayer. The whited dashed lines emphasize the alignment of the defects. Three observed dark, vertical lines are artifacts coming from the slits. Bright colors show higher intensity. (b) XBDI and (c) AFM comparison of a similar defect.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 28| Part 1| January 2021| Pages 301-308
https://doi.org/10.1107/S1600577520014149
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