Role of threading dislocations on the growth of HgCdTe epilayers investigated using monochromatic X-ray Bragg diffraction imaging

Yildirim, C.; Ballet, P.; Santailler, J.-L.; Giotta, D.; Obrecht, R.; Tran Thi, T.N.; Baruchel, J.; Brellier, D.

doi:10.1107/S1600577520014149

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Figure 6
(a) Integrated intensity map of 12 images at the high θ weak-beam condition of the MCT layer showing the growth islands around the threading dislocations. (b) Intensity profile of the red line of the image (a). Intensity scales are the same for both images.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 28| Part 1| January 2021| Pages 301-308

https://doi.org/10.1107/S1600577520014149

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