Two-stage reflective self-seeding scheme for high-repetition-rate X-ray free-electron lasers

Zhou, G.; Qu, Z.; Ma, Y.; Corbett, W.J.; Jiao, Y.; Li, H.; Qin, W.; Raubenheimer, T.O.; Tsai, C.-Y.; Wang, J.; Yang, C.; Wu, J.

doi:10.1107/S1600577520014824

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Figure 2
Reflectivity and absorption curves of given atomic layers and photon energies: (a) Si(111) with 4.5 keV X-rays; (b) Si(311) with 4.5 keV X-rays; (c) Si(111) with 9.5 keV X-rays; (d) Si (004) with 9.5 keV X-rays.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 28| Part 1| January 2021| Pages 44-51

https://doi.org/10.1107/S1600577520014824

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