Figure 5
The attenuation factor of a 150 nm (black dashed line) and 60 nm (red line) thick aluminium, SiO2 and Si3N4 light-blocking filter deposited on the entrance window of the pnCCD sensor. The filter efficiently suppresses near-infrared, visible and ultaviolet radiation up to 10 eV by a factor 107 or 104, respectively. The influence of the aluminium absorption decreases due to the plasma frequency cutoff at ωp ≃ 16 eV resulting in the refractive index n becoming increasingly smaller between 15 eV and 73 eV, the Al L-edge. |