view article
Figure 1
Comparison between SEM micrographs of crystals A and B and sample morphology recovered from BCDI at room temperature (23°C). (a) SEM micrographs of the FIB milled crystals. (b) Superimposed reconstructions of the two measured linearly independent reflections for each crystal. Opaque morphologies are rendered to allow examination of their agreement. The near vertical line in crystal B corresponds to a twin domain boundary on the bottom face. (c) Average morphology of the two reflections for each crystal. The amplitude threshold for (b) and (c) is 0.30. The coordinate axes are positioned in sample space and plotted with a length of 500 nm.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 28| Part 2| March 2021| Pages 550-565
https://doi.org/10.1107/S1600577520016264
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS