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Figure 12
(a) Si L2,3 X-ray absorption spectrum of Si(001) wafer measured in the TEY mode. The coloured vertical lines indicate few selected photon energies corresponding to RIXS measurements. (b) Incident photon energy dependent RIXS spectra of Si(001) wafer. From bottom to top, the spectra were measured with Ein = 99.5 to 108 eV, the steps were set to 0.25 eV between Ein = 95.5 and 104 eV and to 0.5 eV above Ein = 104 eV. The black, blue, cyan, green, orange and blue curves represent photon energies depicted with vertical bars of the same colour in (a).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 28| Part 2| March 2021| Pages 588-601
https://doi.org/10.1107/S1600577521000564
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