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Figure 9
(a) Image of the bar pattern acquired with Ge fluorescence (9.9 keV). (b) Small ROI covering the area of the four adjacent readout chips (dashed lined). (c) Bar pattern profile with corresponding CTF values.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 28| Part 2| March 2021| Pages 439-447
https://doi.org/10.1107/S1600577520016665
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