A refraction correction for buried interfaces applied to in situ grazing-incidence X-ray diffraction studies on Pd electrodes

Landers, A.T.; Koshy, D.M.; Lee, S.H.; Drisdell, W.S.; Davis, R.C.; Hahn, C.; Mehta, A.; Jaramillo, T.F.

doi:10.1107/S1600577521001557

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Figure 4
GIXRD measurements of a Pd thin-film electrode held at +0.9 V versus RHE in a 0.1 M K_3–xH_xPO₄ aqueous electrolyte (pH ∼6.8). (a) GIXRD measurements as collected, (b) correction of the measurements for refraction using equation (10)

applied to an ideal H₂O–Pd interface.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 28| Part 3| May 2021| Pages 919-923

https://doi.org/10.1107/S1600577521001557

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