A refraction correction for buried interfaces applied to in situ grazing-incidence X-ray diffraction studies on Pd electrodes

Landers, A.T.; Koshy, D.M.; Lee, S.H.; Drisdell, W.S.; Davis, R.C.; Hahn, C.; Mehta, A.; Jaramillo, T.F.

doi:10.1107/S1600577521001557

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Figure 5
Peak centers for GIXRD measurements of a Pd thin-film electrode held at +0.9 V versus RHE in a 0.1 M K_3–xH_xPO₄ aqueous electrolyte corrected for refraction using various values for the effective critical angle. The red circles show the value of the effective critical angle where the peak positions appear to converge.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 28| Part 3| May 2021| Pages 919-923

https://doi.org/10.1107/S1600577521001557

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