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![[Figure 2]](pp5170fig2mag.jpg)
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Figure 2
Schematic of the hemispherical detector with an FM-SC spin-filter detector combination. The principle of optical spin detection in a hybrid structure consists of a thin magnetic layer deposited on a semiconductor structure. The magnetic layer has an in-plane easy magnetization axis and works as a spin filter for incoming electrons with the spin components Sx and Sy parallel to the surface. Electrons transmitted through the metal/semiconductor junction recombine radiatively in the SC structure (quantum wells, QDs). Because of the electron spin filtering across the FM-SC structure, the CL intensity (Ix, Iy), collected from the rearside, is found to be dependent on the relative orientation between the injected electronic spin polarization and the FM layer magnetization (Li et al., 2014  ). The measured difference in light intensity Px,y = (Ix,y↑ − Ix,y↓)/(Ix,y↑ + Ix,y↓) is proportional to the polarization of injected electrons and thus allows the user to determine two spin projections in the plane of the detector. Electrons injected with out-of-plane polarization, transmitted through the FM-SC junction, recombine radiatively in the semiconductor structure with circular polarization, which can be detected by means of polarizing optics (quarter-wave plate and linear polarizer). The measured light polarization degree Pz = (Iz↑ − Iz↓)/(Iz↑ + Iz↓) is proportional to the polarization of injected electrons and thus allows the user to determine the out-of-plane spin projection of the detector. Combination of the spin detector with optical detectors, such as an image intensifier and/or a CCD camera outside of the vacuum chamber is promising in the realization of multichannel spin detection. |
![[Figure 2]](pp5170fig2.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
