Figure 5
Time-resolved measurement of a SrRuO3 thin film after laser excitation in low-α operation mode of BESSY II. (a) Time-resolved strain η (filled blue symbols) in a 157 nm-thick layer after optical excitation at room temperature with 1028 nm using a fluence F = 2.5 mJ cm−2 as a function of delay τL. A simulation of the transient strain using the UDKM1DSIM toolbox (Schick et al., 2014a) is shown by the dashed blue line. Its convolution with a time-resolution of 17 ps (FWHM) is shown by the blue solid line. The pulse length of the X-ray pulses is indicated by the filled red Gaussian pulse at τL = 0. (b) RSM of the 002 Bragg reflection of SrRuO3. The color plot is a snapshot at τL = −40 ps before laser excitation and the thin lines on top are measured at τL = +40 ps. |