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Figure 1
Phase-contrast imaging. (a) Schematic of the experimental setup for high-resolution phase-contrast imaging. An X-ray beam is focused using reflective (Kirkpatrick–Baez) optics. The sample is placed at different positions zn relative to the focus (zf) and detector (zD) positions for different amounts of magnification and consequently different effective propagation distances. (b)–(f) Phase-contrast images acquired at sample positions progressively further from the focus (and thus closer to the detector) showing the varying degree of magnification and phase contrast (acquired at NanoMAX, MAX IV, Lund, Sweden). The scale bar is shown for the highest-resolution image and corresponds to 2.5 µm.

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