Figure 6
(a) Signal-to-noise ratio as a function of the photon flux illuminating the sample for different values of the sample thickness. The photon flux at which the maximum of the signal-to-noise ratio occurs scales with the thickness of the sample. (b) Signal-to-noise ratio as a function of the photon flux reaching the APD detector for the same values of the sample thickness as in (a). In this case, the maximum of the signal-to-noise ratio occurs at the same photon flux (reaching the APD detector), independently from the thickness of the sample. The white background identifies the linear regime, the light blue background the semi-linear regime, and the dark blue background the non-linear regime. |