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Figure 2
X-ray reflectivity curves for 14.4 keV radiation measured at 15 different positions on the gradient Fe60Al40 film (left-hand side, dots are the experimental data and solid lines are the fit) and the results of their fit (right-hand side), giving the depth profiles of the X-ray refraction |δ| proportional to the electronic density. All curves are shifted vertically. The dashed vertical line is drawn in order to clarify the small change in the oscillation frequency, corresponding to the increase in the film thickness caused by ion irradiation.

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ISSN: 1600-5775
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