view article
Figure 2
X-ray reflectivity curves for 14.4 keV radiation measured at 15 different positions on the gradient Fe60Al40 film (left-hand side, dots are the experimental data and solid lines are the fit) and the results of their fit (right-hand side), giving the depth profiles of the X-ray refraction |δ| proportional to the electronic density. All curves are shifted vertically. The dashed vertical line is drawn in order to clarify the small change in the oscillation frequency, corresponding to the increase in the film thickness caused by ion irradiation.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 28| Part 5| September 2021| Pages 1535-1543
https://doi.org/10.1107/S1600577521007694
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS