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Figure 4
High-resolution XBIC maps using the off-axis illuminated MZP with a step size of 20 nm. (a) STXM image of a single nanowire device. Next to the STXM image is a schematic of a nanowire roughly indicating the doping segments. (b) XBIC maps from the sketched red square in (a), using different X-ray fluxes of a transmission of 0.6%, 2.5%, 17.2% and 100% of the maximum X-ray photon flux (Φ = 2.41 × 107 photons s−1). Scalebars: 250 nm. The horizontally dashed lines indicate the doping junctions. (c) Axial and radial XBIC profiles, in logarithmic scale. (d) XBIC maps at different applied biases using Φ = 4.14 × 106 photons s−1. (e) Axial and radial XBIC profiles, extracted from the XBIC maps in (d). Scalebars: 250 nm.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 28| Part 5| September 2021| Pages 1573-1582
https://doi.org/10.1107/S1600577521006159
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