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Figure 4
Schematic illustration of the off-axis electron holography setup. (a) Conventional off-axis electron holography. Half of the beam passes through the specimen (sampling beam) and the other half goes through the vacuum (reference beam). The two beams are next to each other, and the illuminated area can only be at the edge of the sample. Two beams are superimposed by the electron biprism, a positively charged wire, and interfere at the detector plane. (b) Split-illumination holography. The beam is split by condenser biprisms. The reference and sampling beam can go through two neighboring holes of the sample grid.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 28| Part 5| September 2021| Pages 1343-1356
https://doi.org/10.1107/S1600577521007931
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