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Figure 4
(a) N K-edge XANES spectra measured in TEY mode taken in situ during the growth of Fe-N film on a quartz substrate at 300 K using reactive magnetron sputtering. (b) Enlarged region covering features a and b. The inset shows the variation in the intensity of features a and b with thickness. The different regions I, II and III are classified on the basis of changes in the energy position and intensity variation of features a and b with increasing thickness.

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