Journal of Synchrotron Radiation
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Figure 5
N
K
-edge XANES spectra measured in TEY mode taken
in situ
during the growth of Co-N film on a quartz substrate at 300 K using reactive magnetron sputtering. The different growth regions are also shown.
JOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 28
|
Part 5
|
September 2021
|
Pages 1504-1510
https://doi.org/10.1107/S1600577521006822
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The IUCr is a scientific union serving the interests of crystallographers and other scientists employing crystallographic methods.