Figure 10
Angle-integrated Si 2p photoemission spectra measured at (a) position A, (b) position B and (c) position C on the Si(111) wafer in Fig. 9(c). The value of hν was 750 eV. The total ΔE was 90 meV. The sample temperature was 80 K. The beam spot on the sample was 5 µm × 4 µm in size. |