|
Figure 9
(a) Optical microscope image of the Si(111) wafer before the ARPES measurements. (b) Optical microscope image of the Si(111) wafer after scratching the surface in situ. Note that this image was observed not by the camera in Fig. 3 ![]() |
|
Figure 9
(a) Optical microscope image of the Si(111) wafer before the ARPES measurements. (b) Optical microscope image of the Si(111) wafer after scratching the surface in situ. Note that this image was observed not by the camera in Fig. 3 ![]() |