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Figure 2
(a) An SEM image of the 1 µm pinhole fabricated by FIB processing on a Pt foil. (b) A coherent X-ray diffraction pattern from the pinhole.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 28| Part 5| September 2021| Pages 1610-1615
https://doi.org/10.1107/S1600577521006263
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