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Figure 3
(a) A photograph of a tender X-ray ptychography measurement system installed with a temperature stabilization system on the BL27SU beamline at SPring-8. (b) The time dependence of the amount of drift of the beam position in the sample plane in the horizontal and vertical directions for pinhole optics with and without temperature control and for FZP optics with temperature control.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 28| Part 5| September 2021| Pages 1610-1615
https://doi.org/10.1107/S1600577521006263
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