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Figure 4
Images reconstructed from the ptychographic diffraction patterns measured using the pinhole optics and the FZP optics at 2.500 keV. (a) Phase images of the Ta test chart. (b) Amplitude images of the illumination field.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 28| Part 5| September 2021| Pages 1610-1615
https://doi.org/10.1107/S1600577521006263
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