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Figure 5
(a) An SEM image of the sulfur polymer material. (b), (c) Reconstructed images of the sulfur polymer material at 2.4732 keV, (b) phase image, (c) μt image. (d) Ptychographic XAFS spectra at positions 1, 2 and 3 and area average (25 × 25 pixels) in panel (c) and reference XAFS spectrum. (e) Phase spectrum normalized by Δμt at positions 1, 2 and 3.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 28| Part 5| September 2021| Pages 1610-1615
https://doi.org/10.1107/S1600577521006263
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