Spectral monitoring at SwissFEL using a high-resolution on-line hard X-ray single-shot spectrometer

David, C.; Seniutinas, G.; Makita, M.; Rösner, B.; Rehanek, J.; Karvinen, P.; Löhl, F.; Abela, R.; Patthey, L.; Juranić, P.

doi:10.1107/S1600577521009619

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Figure 2
Diffracted orders of the full beam observed by the saturated profile monitors between the grating and Bragg crystal chambers (a), and the raw image of the spectrum on the PSSS detector (b).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 28| Part 6| November 2021| Pages 1978-1984

https://doi.org/10.1107/S1600577521009619

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