Repeatability and sensitivity characterization of the far-field high-energy diffraction microscopy instrument at the Advanced Photon Source

Park, J.-S.; Sharma, H.; Kenesei, P.

doi:10.1107/S1600577521008286

Journal of Synchrotron Radiation Journal of
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Figure 10
A histogram plot of the difference in elastic strain tensors between the tracked grains in DS-D-SS between the first scan and Ω = 0.25° without account for Ω in the MIDAS analysis. Strain units in 10⁻⁴.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 28| Part 6| November 2021| Pages 1786-1800

https://doi.org/10.1107/S1600577521008286

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