Repeatability and sensitivity characterization of the far-field high-energy diffraction microscopy instrument at the Advanced Photon Source

Park, J.-S.; Sharma, H.; Kenesei, P.

doi:10.1107/S1600577521008286

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 11
An example of a grain COM map acquired using the FF-HEDM instrument. The number of grains found is approximately 20000. The position of the dots denotes the grain COM in space and the color of the dots denotes the grain radius.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 28| Part 6| November 2021| Pages 1786-1800

https://doi.org/10.1107/S1600577521008286

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