Repeatability and sensitivity characterization of the far-field high-energy diffraction microscopy instrument at the Advanced Photon Source

Park, J.-S.; Sharma, H.; Kenesei, P.

doi:10.1107/S1600577521008286

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

IUCr IT WDC

home archive editors for authors for readers submit open access

view article

Figure 2
The MIDAS analysis framework and relevant coordinate systems. A polycrystalline sample is rotated about $[{\bf{y}}_{\rm L}^{\prime}]$ and the rotation is denoted as ω. The angle between y_L and $[{\bf{y}}_{\rm L}^{\prime}]$ is denoted as Ω.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 28| Part 6| November 2021| Pages 1786-1800

https://doi.org/10.1107/S1600577521008286

Open

access

Follow J. Synchrotron Rad.

Search IUCr Journals		doi		Advanced search
Author		volume	page