Repeatability and sensitivity characterization of the far-field high-energy diffraction microscopy instrument at the Advanced Photon Source

Park, J.-S.; Sharma, H.; Kenesei, P.

doi:10.1107/S1600577521008286

Journal of Synchrotron Radiation Journal of
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Figure 3
Histograms of COM Y difference between matched grains without (left) and with (right) the volume filter for a repeatability scan. In the left-hand figure, the Y-axis is truncated from 120 to show the values at higher Y values.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 28| Part 6| November 2021| Pages 1786-1800

https://doi.org/10.1107/S1600577521008286

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