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Figure 2
Setup, not to scale, for the dual beam ptycho-fluorescence imaging method. The two energies E1 (green) and E2 (blue) have a different beam size at the sample, D1 and D2, respectively. The XPCD detector in the far field records the diffraction patterns for E1, while the central beam stop blocks the direct beam. Inset: schematic of the beams overlap in the dual beam scan method, where the probe size for the XRF (blue) matches the step size of the ptychography scan (green).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 28| Part 6| November 2021| Pages 1916-1920
https://doi.org/10.1107/S1600577521008675
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