view article
Figure 3
Correlative XAS–XEOL images recorded on a ZnO crystallite agglomerate of the ZnO-L sample. (a) False-color many-energy STXM image showing XNLD orientation contrast retrieved through SiVM-NNLS analysis. The white parallelogram indicates the region at which XEOL data were recorded. (b) Zn L-edge XANES retrieved from the many-energy STXM map at the locations indicated by the white crosses. (c) False-color XEOL image, obtained by integrating the band gap emission (352–390 nm, red channel), green trap state emission (455–500 nm, green channel) and blue trap state emission (399–442 nm, blue channel) collected with the excitation energy tuned to 1050 eV. (d) XEOL spectra retrieved from the hyperspectral XEOL map at the locations indicated by the white crosses.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 28| Part 6| November 2021| Pages 1858-1864
https://doi.org/10.1107/S1600577521009450
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS