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Figure 4
Correlative XAS–XEOL images recorded on a ZnO crystallite agglomerate of the ZnO-W sample. (a) False-color two-energy STXM image showing XNLD orientation contrast. The white parallelogram indicates the region at which XEOL data were recorded. (b) False-color XEOL image, obtained by integrating the band gap emission (352–390 nm, red channel), green trap state emission (451–601 nm, green channel) and blue trap state emission (399–427 nm, blue channel) collected with the excitation energy tuned to 1050 eV. (c) XEOL spectra retrieved from the hyperspectral XEOL map at the locations indicated by the white crosses and the white arrow.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 28| Part 6| November 2021| Pages 1858-1864
https://doi.org/10.1107/S1600577521009450
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