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![[Figure 3]](ok5051fig3mag.jpg)
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Figure 3
X-ray images recorded by the CCD camera (pixel size of 9 µm). (a) Direct X-ray beam without any Laue crystals or samples. (b) Direct X-ray beam without Laue crystals but with the sample. The components are labeled; see also the sample schematic shown in Fig. 2(a). An L-shaped metal bar is fixed to the sample for alignment. (c) Si(311) Laue diffracted X-ray beams with two crystals without the sample (denoted as I0). The broader beam with the higher X-ray intensity on the right is diffracted by Crystal 1. The artifacts visible in the X-ray beam are due to crystal defects and the X-ray transmission through the Crystal 2 holder. The left-hand beam is diffracted by Crystal 2. (d) The Si(311) Laue diffracted X-ray beams with both crystals and the sample (denoted as IS). The horizontal energy gradients can be visually distinguished, as the intensity fringes relate to the X-ray absorption fine structures. Also, the spatial information of the sample is well conserved, though some horizontally compressed distortions are present. (e) The absorption image is calculated pixel-to-pixel from I0 and IS by Lambert–Beer's law, which also removes the artifacts discussed for panel (c) from the data. (f) The absorption image is split into six regions of interest (ROIs). (g) By averaging all values in the ROIs along the vertical direction, the spectra can be generated as a function of pixels. |
![[Figure 3]](ok5051fig3.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
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