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Figure 2
Linear combination fitting results of X-ray absorption near-edge structure spectra for oxidized Si (a) and oxidized Cu [by TEY (b) and CEY (c)]. Gray and blue lines indicate the substrate (Si, Cu) and film (SiO2, Cu2O), respectively, while circles and red lines indicate the data and fit, respectively.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 28| Part 6| November 2021| Pages 1820-1824
https://doi.org/10.1107/S1600577521009401
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