journal menu
![[Figure 2]](rv5156fig2mag.jpg)
|
|
Figure 2
O K-edge spectra of 100 nm-thick windows and other materials used for O K-edge measurements. All spectra were measured using partial fluorescence yield and have been normalized except as noted. (a) Stoichiometric silicon nitride windows: blue – after storage for some months, green – freshly manufactured, stored under argon and measured within 2 weeks, red – after 10 s hydrofluoric acid washing. These spectra are normalized to the same scale as the silicon-rich nitride spectra in (b). (b) Silicon-rich nitride windows showing the time-dependence of the pre-edge structure (arrowed): blue – first scan, green and red – subsequent scans. (c) Diamond windows. We note that the intensity of this signal is about double that of silicon-rich nitride. (d) Carbon tape. (e) Pressed indium: blue – as supplied, red – after cleaning via washing in solvents and an acid etch. These spectra are normalized to the same scale. |
![[Figure 2]](rv5156fig2.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
