NanoMAX: the hard X-ray nanoprobe beamline at the MAX IV Laboratory

Johansson, U.; Carbone, D.; Kalbfleisch, S.; Björling, A.; Kahnt, M.; Sala, S.; Stankevic, T.; Liebi, M.; Rodriguez Fernandez, A.; Bring, B.; Paterson, D.; Thånell, K.; Bell, P.; Erb, D.; Weninger, C.; Matej, Z.; Roslund, L.; Åhnberg, K.; Norsk Jensen, B.; Tarawneh, H.; Mikkelsen, A.; Vogt, U.

doi:10.1107/S1600577521008213

Journal of Synchrotron Radiation Journal of
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Figure 4
Monochromatic X-ray beam profile on the secondary source aperture measured at 14 keV. Secondary source aperture sizes for different operation modes are indicated in the intensity profile. From small to large aperture: full coherence illumination, high flux illumination and 100 nm spot size at the KB-focus. The scale bar is 25 µm. Intensity profiles in the vertical and horizontal directions show a FWHM of 160 µm (H) × 10 µm (V).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 28| Part 6| November 2021| Pages 1935-1947

https://doi.org/10.1107/S1600577521008213

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