NanoMAX: the hard X-ray nanoprobe beamline at the MAX IV Laboratory

Johansson, U.; Carbone, D.; Kalbfleisch, S.; Björling, A.; Kahnt, M.; Sala, S.; Stankevic, T.; Liebi, M.; Rodriguez Fernandez, A.; Bring, B.; Paterson, D.; Thånell, K.; Bell, P.; Erb, D.; Weninger, C.; Matej, Z.; Roslund, L.; Åhnberg, K.; Norsk Jensen, B.; Tarawneh, H.; Mikkelsen, A.; Vogt, U.

doi:10.1107/S1600577521008213

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Figure 7
KB optics. Simulation of focusing properties using mirror parameters from Table 4

and measured mirror figure errors. Top row: (a, b) simulations of the focus at the sample position for 10 keV, (c, d) for 22 keV. (a, c) SSA is set to coherence mode. (b, d) SSA is set to flux mode. Intensities in all images are on normalized logarithmic scales to visualize the diffraction pattern. Bottom row: intensity profiles on normalized linear scales for the corresponding upper image. Red marks indicate the ideal resolution according to equation (1)

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 28| Part 6| November 2021| Pages 1935-1947

https://doi.org/10.1107/S1600577521008213

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