Advanced X-ray imaging at beamline 07 of the SAGA Light Source

Yoneyama, A.; Takeya, S.; Lwin, T.T.; Takamatsu, D.; Baba, R.; Konishi, K.; Fujita, R.; Kobayashi, K.; Shima, A.; Kawamoto, M.; Setoyama, H.; Ishiji, K.; Seno, Y.

doi:10.1107/S1600577521009553

Journal of Synchrotron Radiation Journal of
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Figure 13
(a) X-ray interference image acquired by the XI with thin S and A wafers. Interference images of Au mesh (400 line-space inch⁻¹) acquired by XI with thinned wafers (b) and conventional XI (1 mm-thick wafers) (c). Image (c) is blurred in the diffraction direction (vertical direction) by the Borrmann fan effect.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 28| Part 6| November 2021| Pages 1966-1977

https://doi.org/10.1107/S1600577521009553

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