Single-shot experiments at the soft X-FEL FERMI using a back-side-illuminated scientific CMOS detector

Léveillé, C.; Desjardins, K.; Popescu, H.; Vondungbo, B.; Hennes, M.; Delaunay, R.; Jal, E.; De Angelis, D.; Pancaldi, M.; Pedersoli, E.; Capotondi, F.; Jaouen, N.

doi:10.1107/S1600577521012303

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Figure 2
Dark corrected image of a diffraction peak of striped domains in a Co/Pt multilayer recorded using the AXIS-SRW camera with an integration time of 14.5 ms in HDR mode.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 29| Part 1| January 2022| Pages 103-110

https://doi.org/10.1107/S1600577521012303

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