X-ray beam monitoring and wavelength calibration using four-beam diffraction

Huang, X.; Shi, X.; Assoufid, L.

doi:10.1107/S1600577521012352

Journal of Synchrotron Radiation Journal of
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Figure 3
(a–c) Integrated $[000/006/113/1\bar13]$ 4BD patterns for a Gaussian incidence spectrum (ΔE_BW = 1.5 eV). The intensities are normalized intensities of the main reflection g₁ = 006. The patterns can be generated with a parallel incident beam by 2D rocking of the crystal, or with a divergent beam from a point source as a one-shot image in the XZ coordinate system. Δθ = 0 corresponds to θ_4B = 40.6013°. (a) Central photon energy of the Gaussian spectrum E_c = E_4B (= 10.5236 keV). (b) E_c = E_4B + 0.5 eV. (c) E_c = E_4B + 1 eV. (d) Integrated $[000/006/\bar331/\bar3\bar31]$ 4BD pattern (E_c = E_4B = 8.44807 keV). The color scale is the same as in Fig. 2

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 29| Part 1| January 2022| Pages 159-166

https://doi.org/10.1107/S1600577521012352

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