Using diffraction losses of X-rays in a single crystal for determination of its lattice parameters as well as for monochromator calibration

Klimova, N.; Snigireva, I.; Snigirev, A.; Yefanov, O.

doi:10.1107/S1600577521013667

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 1
Experimental setup. The beam from the bending magnet is incident on the double-crystal monochromator. The intensity of the beam is measured with ion chambers before (I0) and after (I1) the sample. The sample (here a 1D CRL) can be rotated around all three axes.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 29| Part 2| March 2022| Pages 369-376

https://doi.org/10.1107/S1600577521013667

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