addenda and errata
Single-shot experiments at the soft X-FEL FERMI using a back-side-illuminated scientific CMOS detector. Corrigendum
aSynchrotron SOLEIL, L'Orme des Merisiers, Saint-Aubin, BP48, 91192 Gif-sur-Yvette, France, bSorbonne Université, CNRS, Laboratoire de Chimie Physique-Matière et Rayonnement, LCPMR, 75005 Paris, France, and cElettra-Sincrotrone Trieste, Basovizza, Trieste 34149, Italy
*Correspondence e-mail: cyril.leveille@synchrotron-soleil.fr, nicolas.jaouen@synchrotron-soleil.fr
The name of one of the authors in the article by Léveillé et al. [(2022), J. Synchrotron Rad. 29, 103–110] is corrected.
Keywords: CMOS; soft X-ray FEL applications; single-shot experiment; time resolved.
References
Léveillé, C., Desjardins, K., Popescu, H., Vondungbo, B., Hennes, M., Delaunay, R., Jal, E., De Angelis, D., Pancaldi, M., Pedersoli, E., Capotondi, F. & Jaouen, N. (2022). J. Synchrotron Rad. 29, 103–110. CrossRef IUCr Journals Google Scholar
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