Diffuse X-ray scattering from polished silicon: application of the distorted wave Born approximation

Macrander, A.; Assoufid, L.; Narayanan, S.; Khachatryan, R.

doi:10.1107/S1600577522000534

Journal of Synchrotron Radiation Journal of
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Figure 9
Smooth sample: measured longitudinal scattering data for an angular offset of 0.05° (red), calculated specular scattering in the BA (green), calculated diffuse in the DWBA (blue), and total calculated scattering (black).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 29| Part 2| March 2022| Pages 447-455

https://doi.org/10.1107/S1600577522000534

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