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Figure 1
Experimental setup of the horizontal diffractometer and automated sample changer with a furnace in BL04B2. (a) Seven semiconductor detectors, and the flat-panel detector fixed on the diffractometer at around −15.3°. (b) Typical two-dimensional XRD pattern captured by the flat-panel detector. (c) Boron nitride holder containing a quartz capillary (with a diameter of 1.5 mm) and the aperture used to check the height of the sample. (d) Automated sample changer and furnace. Up to 21 samples can be loaded on the plate. (e) Photograph of the automated sample changer on the diffractometer.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 29| Part 2| March 2022| Pages 549-554
https://doi.org/10.1107/S1600577521013527
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